| Abstract : |
SAMP-1 is a complex material model designed to capture non-Mises yield and localization behavior in plastics. To perform well, it is highly dependent on accurate post-yield material data. A number of assumptions and approximations are currently used to translate measured stress-strain data into the material parameters related to these inputs. In this paper, we look at the use of direct localized strain measurements using digital image correlation (DIC) as a way to more directly extract the required data needed for SAMP-1.
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